Smart Double-Cut Via Insertion Flow With Dynamic Design-Rules Compliance For Fast New Technology Adoption
High Performance Electrical Driven Hotspot Detection Solution for Full Chip Design using a Novel Device Parameter Matching Technique
With the continuous development of today’s technology, IC design becomes a more complex process. The designer now not only takes care of the normal design and layout parameters as usual, but also...
Automated Yield Enhancements Implementation on full 28nm Chip: Challenges and Statistics
This paper shares the details of the Yield Enhancements that were done at 28nm full chip level sharing the complexity involved in implementing such a flow and then the verification challenges involved ,...