TrustMe-ViP: A Virtual RF System Platform Project for TPD
Curing Reliability Issues at the IC Design Stage
This presentation offers an introduction to these problems and explains how advanced EDA tools can help integrate the reliability prediction capability in the design cycle itself.
A Nonlinear S-parameters Behavioral Model for RF LNAs
A nonlinear behavioral model for radio frequency low noise amplifiers (LNA’s) is presented. The model captures effects of nonlinearity, output power saturation, noise figure and port impedance mismatch....
Flexible Technology for Mixed-Signal SoC Verification
This webinar will discuss the evolution of digital SoC verification methodology and look at how analog verification can plug into and take advantage of new techniques. It will cover the various verification...