Thermal Characterization of Electronic Components & Systems

Seminar
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Jun 19, 2012
Hampton Court, Surrey, UK
9:45 AM - 4:30 PM Europe/London 		Register
Jun 27, 2012
Stuttgart, Germany
9:45 AM - 5:15 PM Europe/Berlin 		Register

Overview

Information Day - System Level Thermal Testing - Measurement Methodology

T3Ster - Thermal Transient Tester

Spend the day with us learning about our measurement system for the fast and very accurate thermal characterization of electronic components and systems (IC packages, MOSFETS, IGBTs, etc.)

You will also experience hands-on practical exercises with the T3Ster Measurement System.

What You Will Learn

  • Basics of the system and the measurement methodology
  • Basic T3Ster and Modules for diverse application areas - typical configurations
  • Use in practice within the electronic industry, application examples (LEDs, IGBTs, TIMs, etc.)
  • Rth/Zth, structure functions as well as realiability of High Power Electronics
  • Interfacing CFD simulation – thermal analysis concept in completion

About the Presenter

Presenter Image Andras Vass-Varnai

Andras Vass-Varnai obtained his MSc degree in electrical engineering in 2007 at the Budapest University of Technology and Economics. He works as a technical marketing engineer at the MicReD Division at Mentor Graphics since. Beside his work he is also a correspondent Ph.D. student at the Technical University of Budapest. His main topics of interest include thermal management of electric systems, advanced applications of thermal transient testing, characterization of TIM materials and high power semiconductor devices.

Who Should Attend

  • Electronic engineers, physicians, measurement engineers, project managers and laboratory engineers
  • Those who are in charge of ensuring the realiability of electronic components like Chips, IGBTs, MOSFETs, (high power) LEDs as well as LED-chains
  • Those involved in semiconductors, automotive electronics, systems, LED technology

Products Covered

Agenda

Germany

Thermische Charakterisierung von Elektronikkomponenten
Informationstage – T3Ster „System Level Thermal Testing“ – Messmethodik

Thermal Characterization of Electronic Components
Information Days – T3Ster „System Level Thermal Testing“ – Measurement Method

UK

Thermal Characterization of Electronic Components
Information Days – T3Ster „System Level Thermal Testing“ – Measurement Method

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