TERALED
Power-LED thermal and radiometric characterization
TERALED offers combined thermal and radiometric/photometric characterization of high-power LEDs, either as a stand-alone optical measurement system or as an add-on to T3Ster.
Measurement Environment
TERALED® is aimed at the combined thermal and radiometric/photometric characterization of high power LEDs. The TERALED® system is designed such that it can be used as a special measurement environment, an add-on option for Mentor Graphics - MicReD Products' T3Ster® equipment, or it can be used as a stand-alone optical measurement system for LEDs.
Why Choose TERALED?
TERALED® has been developed specifically in response to demand from leading LED manufacturers and provides a unique, complete solution for LED testing. The system is scalable with low initial investment. You can start with just a plain radiometric detector and later upgrade the system to measure luminous flux as well as chromacity coordinates. Combining TERALED® and T3Ster® thermal transient measurements produces highly accurate “structure functions” which provide detailed internal information for power-LED packages revealing die-attach failures and other structural integrity problems.
Related Products
- T3Ster T3Ster® is an advanced thermal testing tool for thermal characterization of semiconductor chip packages. Its high precision hardware and advanced software provides the best thermal testing solution available worldwide.
Datasheet
- TERALED (PDF, 568kb)
Toolbox
Contact Mentor Graphics
- TERALED® Info Request or call toll free: 1-800-547-3000