TERALED
Power LED Thermal and Radiometric Characterization
TERALED® offers combined thermal and radiometric/photometric characterization of high-power LEDs, either in combination with T3Ster thermal transient tester to form a comprehensive LED testing station or as a stand-alone, automated optical testing solution.
Measurement Environment
TERALED is aimed at the combined thermal and radiometric/photometric characterization of high power LEDs. The TERALED system is designed to be used as a special measurement environment, as an add-on option for T3Ster, or as a stand-alone optical measurement system for LEDs.
A 300 mm diameter integrating sphere hosts the temperature controlled DUT fixture, a temperature stabilized reference LED and detector head with a bank of different filters which include equispectral, V(λ), V'(λ), Xshort, Xlong and Z. The detector with photometric filter is matched to the CIE V(λ) function with 1.5% accuracy (f1 error).
To obtain combined optical/thermal measurements, T3Ster is used to provide powering for the LED under test. The control of the thermal measurements and the evaluation of the thermal transients is performed by T3Ster while the measurement sequences required for the photometric and radiometric characterization are performed by TERALED. The measured emitted optical power then is considered by T3Ster when calculating the thermal metrics of the LED under test and the light output characteristics shown by TERALED are provided as function of the real junction temperature. Measurement over a wide range of forward current and LED temperature values is 100% automated thus allowing measurement in a few hours as opposed to manual procedures which could take multiple days.
Features and Benefits
- Developed with the needs of the LED industry in mind
- Ability to obtain combined optical/thermal measurements, consistent thermal and light output metrics
- Structure functions scaled in real thermal resistance allow exploration of LED package details
- Compliant to the CIE 127-2007 standard; when used in combination with T3Ster, compliance with the JEDEC JESD 51-1 static test method is also assured
- A complete and unique solution for LED testing
- Real thermal resistance is measured along with light output metrics as function of real LED junction temperature automatically
- Test the quality of the different thermal interfaces present in SSL applications such as LED die attach, glue/solder between the package and MCPCB, the TIM applied at MCPCB – all strongly influencing LEDs’ life time and lumen maintenance
- All measurement results are compliant to the relevant industrial standards automatically, therefore measured light output metrics and/or thermal metrics are directly applicable on LED product datasheets
The TERALED software (free utilities coming with the TERALED hardware) automates procedures like measurement of emitted flux (photometric or radiant), efficiency, efficacy or chromaticity coordinates as function of temperature and/or operating current. Results are shown in form of diagrams as function of forward current and temperature. Chromaticity coordinates are shown in the CIE color diagram (CIE 1931 2 deg observer). The software smoothly operates with the T3Ster equipment and with the LED version of the T3Ster-Booster family. The LED’s electrical characteristics as well as thermal calibration diagrams are also measured. Results are presented in form of plots. The TERALED control electronics interfaces all devices attached to the sphere with the measurement control computer.
Options and Accessories
TERALED can be used in combination with the LED booster from the T3Ster-Booster family. This way multi-chip LEDs with a forward voltage beyond the 6V limit of T3Ster can also be characterized with the T3Ster+TERALED combination.
Datasheet
Toolbox
- White Paper: When Designing with Power LEDs, Consider Their Real Thermal Resistance
- White Paper: Electric and Thermal Transient Effects in Optical Devices
Contact Mentor Graphics
- TERALED® Info Request or call toll free: 1-800-547-3000