IBIS Modeling of LVDS Buffers
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This report provides detailed information on a study of the effects of internal series termination between positive and negative I/O pads in LVDS buffers. Comparisons between IBIS and SPICE simulations are used to emphasize these effects. Different loading conditions and modeling approaches are considered. IBIS modeling approaches for LVDS buffers are presented. Model validation shows the power of these approaches over other conventional techniques.