The creation of test patterns for mixed signal IP has been, to a large extent, a manual effort. The new IEEE P1687 standard, also called IJTAG, simplifies the access, control and testing of embedded IP, and is expected to be rapidly and widely adopted by the semiconductor industry. Mentor Graphics and NXP Semiconductors (NXP) worked together to implement P1687 on mixed-signal IPs in a 65 nm automotive design. The results demonstrate the significant advantages of P1687 over the current IEEE 1149.1 (JTAG) 2 test methodology, both in automating the test pattern development and in reducing test setup data volume by more than 50%. Read more
Automated Test Creation for Mixed Signal IP Using IJTAG
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