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Silicon Test and Yield Analysis Blog

Posts tagged with 'defect detection'

16 Jan, 2014

Can You Benefit from Cell-Aware Test?

Posted by Shelly Stalnaker

Shelly Stalnaker With the move to small geometries, existing fault models such as stuck-at, transition, bridging, open, and small-delay are becoming less effective at ensuring desired quality levels. While these models only consider faults on cell inputs/outputs and interconnect lines between cells, more defects increasingly occur within the cell structures. A new cell-aware test that directly targets specific shorts, … Read More

test pattern, Tessent, defect detection, ATPG, IC, scan test, fault models, FinFET

 
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