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Silicon Test and Yield Analysis Blog

Posts tagged with 'embedded compression'

17 Mar, 2014

Little Orphan Annie

Posted by Shelly Stalnaker

Shelly Stalnaker

Is design-for-test the forgotten stepchild of IC design? Not any more, and DFT engineers can, in large part, thank the automotive industry. The number of processors built into a vehicle is steadily increasing, as we all know (okay, maybe not that guy driving the 1969 Chevy Camaro). These chips have to meet very high standards for quality and reliability, which means the companies who make them need

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automotive test, Silicon Test, Cell-Aware ATPG, cell-aware, ATPG, logic BIST, Cell Aware Test, Ron Press, embedded compression, semiconductor test, iso26262

 
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