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Silicon Test and Yield Analysis Blog

Posts tagged with 'root cause analysis'

14 Jan, 2014

Are you the 1%?

Posted by Shelly Stalnaker

Shelly Stalnaker Do you have a product that has been manufactured for quite some time at a high volume? If so, maybe it makes financial sense to chase down that last 1% of yield loss. In Geir Eide’s article on EDN.com, he explains how diagnosis-driven yield analysis (DDYA) can help you quickly and efficiently identify the root cause of yield loss, and separate design-based from process-based yield loss. Still … Read More

yield loss, Yield, diagnosis-drive yield analysis, Foundry, DDYA, root cause analysis, root cause deconvolution, layout-aware can diagnosis, RCD

 
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