Sign In
Forgot Password?
Sign In | | Create Account

Silicon Test and Yield Analysis Blog

Posts tagged with 'yield analysis'

18 Feb, 2014

Esperanto for ICs

Posted by Shelly Stalnaker

Shelly Stalnaker In Standards & Travels on EE Times, Bruce Swanson reminisces about a trip he took to Europe, long before there were cell phones, a common currency, or even the Internet. Dealing with different languages, different currencies, and different local customs took time, was a bit frustrating, and sometimes led to mistakes (WHERE is this train going?!). His experiences on that trip came to mind recently … Read More

IEEE standard, IJTAG, desgin for test, yield analysis, P1687, Silicon Test

 
Online Chat