ICs being developed at advanced technology nodes exhibit increased sensitivity to manufacturing variations. A small variation in process will affect layout features that can cause defects in the chip and failures which slow yield ramp and lower mature yields. Investigating these types of defects can take weeks or months of effort in the failure analysis lab.

YieldAssist™ is an advanced scan test diagnosis tool that performs accurate and high-resolution diagnosis using tester failure data, design netlists, and layout data. YieldAssist determines the defect’s most probable failure mechanism, logic location, and physical location.

To use diagnosis for driving yield and failure analysis, the highest quality test sets need to be applied to the ICs. Mentor Graphics’ TestKompress® meets this requirement. YieldAssist performs diagnosis on compression-mode TestKompress production test patterns. For designs that don’t require compression, Mentor Graphics’ FastScan™ can be used for test pattern generation.

Product Demo

Mentor Technology Viewpoint

Diagnosis-driven yield analysis can rapidly identify probable cause of failures, enabling you to implement corrective actions in the manufacturing process or make changes to the design. Accurate diagnosis allows you to accelerate yield ramp during initial production and improve expected yields for mature products, speeding your time to market and increasing profitability.

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Diagnosis Driven Yield AnalysisProduct Demo