YieldAssist

High quality test drives yield and failure analysis

YieldAssist™ is an advanced scan test diagnosis tool that performs accurate and high-resolution diagnosis using tester failure data, design netlists, and layout data. YieldAssist determines the defect’s most probable failure mechanism, logic location, and physical location.

The Mentor Graphics YieldAssist™ advanced failure diagnosis tool provides a comprehensive set of functionality to quickly analyze devices that fail manufacturing test. YieldAssist leverages production scan test patterns generated by the FastScan™ ATPG tool and the TestKompress® test pattern compression tool to rapidly and accurately identify and isolate yield-limiting defect areas.

Benefits and Features

  • Performs detailed analysis of devices that fail manufacturing test
  • Layout-aware diagnosis is used to increase resolution and isolate defects to a specific location
  • Included in the TSMC and UMC reference flows
  • Effectively identify root cause of manufacturing test failures
  • Enable diagnosis-driven yield analysis through fail log monitoring and high-throughput distributed processing
  • Provides diagnosis-specific ATPG algorithms to accelerate failure analysis
  • Includes server mode operation that automates process of diagnosing large volumes of failing die

Related Products

  • TestKompressATPG with Embedded Compression. Industry leading automatic test pattern generation (ATPG) tool that delivers the highest quality scan test with the lowest manufacturing cost using patented on-chip compression techniques to reduce test data volume and time on automatic test equipment.
  • FastScanAdvanced Scan ATPG. A powerful automatic test pattern generation tool available with the wide range of fault models, comprehensive design rules checks, clocking support and innovative algorithms to generate high coverage, compact test sets quickly.
  • Calibre YieldEnhancerCalibre® YieldEnhancer offers an automated approach to layout enhancements that will improve yield.
  • Calibre YieldAnalyzerCalibre YieldAnalyzer integrates random (critical area) and systematic (critical feature) process variability analysis using model-based algorithms that automatically plug layout measurements into yield-related equations to help you identify areas of your physical design that have higher sensitivity to variations across the manufacturing process window.

Solutions

Yield Ramp

Diagnosis-driven yield analysis can rapidly identify probable cause of failures, enabling you to implement corrective actions in the manufacturing process or make changes to the design. Accurate diagnosis allows you to accelerate yield ramp during initial production and improve expected yields for mature products, speeding your time to market and increasing profitability. Learn more

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