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Optimizing yield and performance in a nanometer world

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Overview

GLOBALFOUNDRIES / Mentor Graphics Seminar at DATE

Delivering a correct, high yielding product on time is the ultimate goal for a semiconductor development team. Reaching this goal becomes more and more difficult, as systematic defects to a larger degree are design specific. This event describes methodologies that drive yield of digital semiconductor devices through design and test data, augmenting traditional solutions. This flow can be implemented as a foundation of a collaborative process between fabless and foundry customers, benefiting both sides. It presents fast, high quality volume diagnosis and subsequent statistical analysis as two complementing technologies to carry out this methodology. The underlying technology key to the methodology is an extremely accurate and consequential single-die diagnosis of scan test failures. This gives failure analysis engineers or engineers involved in nondestructive testing and evaluation, a proven, very fast, and highly effective new way of defect localization and identification, complementing their traditional, hardware-based methods.

What You Will Learn

  • Best practices for data collection and diagnosis of digital semiconductor devices in a fabless/foundry flow
  • Techniques to pick the correct dies for an effective failure analysis
  • Layout-aware diagnosis
  • Diagnosis-driven yield analysis
  • DFM-aware yield analysis
  • Case studies based on 32nm and 28nm silicon data

DATE 2012DATE Conference

Design, Automation & Test in Europe
International Congress Center
12 - 16 March, 2012 - Dresden, Germany

About the Presenters

Presenter Image Thomas Herrmann

Thomas Herrmann is MTS Product Engineer at GLOBALFOUNDRIES Yield Analysis Systems team focusing on Yield Learning through Scan Diagnosis. Previously, at AMD, Thomas was a member of the Dresden Design Center taking care of DFT, Test and Product Engineering as well as yield and defect analysis of a number of complex digital products. He earned his MS in computer science from the University at Jena, Germany.

Presenter Image Geir Eide

Geir Eide is the product marketing manager for the Silicon Learning Products in the Silicon Test Solutions group at Mentor Graphics. His current focus is on diagnosis and yield analysis. He has previously held positions related to design-for-test, semiconductor test, and silicon debug, in the design automation and semiconductor test industry. He earned BS and MS degrees in Electrical and Computer Engineering from the University of California at Santa Barbara, and has an engineering degree from Kongsberg College of Engineering, Norway.

Who Should Attend

  • Engineers and managers responsible for physical design, test, quality, or yield of a product
  • Engineers and managers responsible for product and technology bring-up
  • Failure Analysis Lab Managers or Process Engineers
  • Engineers involved in manufacturing production or process development
  • Anyone involved with the financial impact of low yield or low product quality

Products Covered

 
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