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Diagnosis-Driven Yield Analysis
(3)
Layout-Aware Diagnosis
Beyond Pass/Fail Testing: Using Failure Data from Manufacturing Test for Yield
YieldAssist and Its Successful Industrial Applications
Logic Test
(8)
Combining Compression with Fewer Pins Dramatically Saves I/O during Multi-Site Test
At-Speed and Advanced Fault Models for Achieving High Quality Test
Logic BIST Application and Usage
Memory Test
(4)
Achieving High-Quality Test for ARM Artisan Memories
At-Speed Embedded Memory Test
Testing Large-Capacity CAM with MBISTArchitect and FastScan MacroTest
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Layout-Aware Diagnosis: Better Failure and Yield Analysis Web Seminar
Aug 11, 2009 : Online
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Low Pin Count Test with Embedded Compression Web Seminar
Jul 21, 2009 : Online
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