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The Coming IJTAG Revolution

Overview

This event will cover exciting developments related to the deployment of the upcoming IEEE P1687 standard. This new standard creates an environment for plug-and-play integration and usage of the instrumentation related portions of IP blocks. The standard will play a critical role in helping design teams successfully integrate the growing amount of IP used in today’s complex designs. The event will include presentations from the IEEE P1687 working group and a Tessent customer taking advantage of the new standard.

International Test Conference

About the Presenters

Presenter Image Jeff Rearick

Jeff Rearick is a Senior Fellow at AMD, where he has led the Design For Testability Center of Expertise since 2006. Prior to that, he spent 22 years at HP and Agilent Technologies working on many aspects of DFT and testing, from product engineering to architecture to CAD. Along the way, he has published dozens of technical papers and has received over 40 US patents in areas ranging from test circuitry to pattern generation techniques. He is currently serving as Editor for the IEEE P1687 working group and was an active contributor to IEEE 1149.6. He holds degrees in Electrical Engineering from Purdue University and the University of Illinois.

Presenter Image Stefan Eichenberger

Stefan Eichenberger joined NXP Semiconductors in Zurich in 1993 which was then Phillips Semiconductors as a test and DFT Engineer. He has been engaged in defining the DFT tool set since 1995. He was a member of the CAT Steering Board for the CAT tools which was later acquired by Mentor. He spent two years from 1997-1999 at the NXP Test Factory in Kaoshiung and then returned to Nijmegen in 2001 to work on corporate test strategies and has been the DfX Technology Manager since 2009. He received his PhD in Science (Physics) at the University of Zurich, 1993.

Presenter Image Stephen Pateras

Stephen Pateras is a product marketing director at Mentor Graphics. His previous position was VP Marketing at LogicVision. While at LogicVision Stephen also held senior management positions in engineering and was instrumental in defining and bringing to market several generations of LogicVision’s products. From 1991 to 1995, Stephen held various engineering lead and management positions within IBM’s mainframe test group. He received his Ph.D. in Electrical Engineering from McGill University in Montreal, Canada.

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