Sign In
Forgot Password?
Sign In | | Create Account

Mentor at SEMICON West 2014

Be sure to visit Mentor Graphics in Booth 6239 at SEMICON West 2014. Mentor Graphics Tessent® is the industry leading solution for test bring-up, silicon characterization, diagnosis-driven yield analysis and failure analysis. Specialized statistical analysis eliminates diagnosis noise and accelerates the time to root cause of yield loss. Talk with our test experts and learn more about "Faster Time to Root Cause."

PCB Forum


Keynote presentations by industry experts from Mentor at the Semiconductor Technology Symposium (STS):

  • Geir Eide, The Next Generation Scan Test Diagnosis,
    Moscone North, Tuesday, Hall E, Room 130, 1:30 pm
  • Stephen Pateras, DFT Challenges and Solutions,
    Moscone North, Wednesday, Hall E, Room 120, 9:00 am
  • Geir Eide, Recent Diagnosis Innovations and What They Mean for Test;
    Test Vision 2020 Workshop: July 9-10, 2014

More information on Silicon Test Solutions for Diagnosis-Driven Yield Analysis:

Mentor will also showcase the MicReD Power Tester 1500A which is the only commercially available thermal testing product that combines both power cycling and thermal transient measurements with structure function analysis while providing data for real-time failure-cause diagnostics.

Online Chat