Keynote presentations by industry experts from Mentor at the Semiconductor Technology Symposium (STS):
- Geir Eide, The Next Generation Scan Test Diagnosis,
Moscone North, Tuesday, Hall E, Room 130, 1:30 pm
- Stephen Pateras, DFT Challenges and Solutions,
Moscone North, Wednesday, Hall E, Room 120, 9:00 am
- Geir Eide, Recent Diagnosis Innovations and What They Mean for Test;
Test Vision 2020 Workshop: July 9-10, 2014
More information on Silicon Test Solutions for Diagnosis-Driven Yield Analysis:
Mentor will also showcase the MicReD Power Tester 1500A which is the only commercially available thermal testing product that combines both power cycling and thermal transient measurements with structure function analysis while providing data for real-time failure-cause diagnostics.
product overview: The MicReD® Industrial Power Tester 1500A tests the reliability of power electronic components that are increasingly used in industries such as automotive and transportation.