http://www.mentor.com This feed contains recent additions for Silicon Test and Yield Analysis Resources en Mentor Graphics Wed, 19 Jun 2013 22:52:14 GMT web_info@mentor.com http://www.mentor.com/mentor2/images/logo.gif http://www.mentor.com http://feedproxy.google.com/~r/mgc_silicon-yield/~3/5RTchWa3_T0/bounce <p>Addressing new silicon challenges with Tessent IJTAG</p><img src="http://feeds.feedburner.com/~r/mgc_silicon-yield/~4/5RTchWa3_T0" height="1" width="1"/> Silicon Test and Yield Analysis Industry Article Wed, 05 Jun 2013 07:00:00 GMT http://www.mentor.com/bounce?redirect=http://www.evaluationengineering.com/articles/201306/addressing-new-silicon-test-challenges-with-ijtag.php&rssid=3d600c8d-75df-d4e5-59f7-6c6862ddd478 http://feedproxy.google.com/~r/mgc_silicon-yield/~3/kWeV4tzIYSc/bounce <p><strong>WILSONVILLE, Ore., June 4, 2013</strong>&mdash;Mentor Graphics Corp. (NASDAQ: MENT) today announced that Freescale&reg; Semiconductor (NYSE:FSL, FSL.B) has selected Mentor as an ideal partner in the silicon test, yield analysis, physical verification and DFM technology areas.</p><img src="http://feeds.feedburner.com/~r/mgc_silicon-yield/~4/kWeV4tzIYSc" height="1" width="1"/> IC Design News Article Tue, 04 Jun 2013 13:00:00 GMT http://www.mentor.com/bounce?redirect=/products/ic_nanometer_design/news/mentor-calibre-dfm-freescale&rssid=3d600c8d-75df-d4e5-59f7-6c6862ddd478 http://feedproxy.google.com/~r/mgc_silicon-yield/~3/KsbYb6MUfi4/bounce <p>&nbsp;</p><img src="http://feeds.feedburner.com/~r/mgc_silicon-yield/~4/KsbYb6MUfi4" height="1" width="1"/> Silicon Test and Yield Analysis Industry Article Fri, 31 May 2013 07:00:00 GMT http://www.mentor.com/bounce?redirect=/resources/industry_articles/upload/10-years-100-000-miles-or-1-dpm-810ffad8-7b04-4a22-95c0-296ce9333fbd&rssid=3d600c8d-75df-d4e5-59f7-6c6862ddd478 http://feedproxy.google.com/~r/mgc_silicon-yield/~3/IBasX65oW74/bounce <p>The growing amount of electronics within today&rsquo;s automobiles is driving very high quality and reliability requirements to a widening range of semiconductor devices. Improvements in test solutions are needed not only to maintain very high quality levels in more advanced technology nodes but to also address increasing reliability requirements such as defined within the ISO 26262 standard. This seminar summarizes the latest approaches in testing automotive semiconductors. It covers, among others, solutions around IEEE P1687 to deterministically target the increasing number of digital and mixed-signal embedded IP, as well as a new hybrid ATPG compression and logic BIST solution that provides more efficient defect coverage together with the ability to apply tests within the system for long-term reliability. This hybrid solution also supports a new cell-aware test generation approach, which is the focus of this seminar.</p><img src="http://feeds.feedburner.com/~r/mgc_silicon-yield/~4/IBasX65oW74" height="1" width="1"/> Silicon Test and Yield Analysis Event Thu, 23 May 2013 07:00:00 GMT http://www.mentor.com/bounce?redirect=/products/silicon-yield/events/automotive-semiconductor-test-quality&rssid=3d600c8d-75df-d4e5-59f7-6c6862ddd478 http://feedproxy.google.com/~r/mgc_silicon-yield/~3/ylUztqRh27g/bounce <p>Design and Manufacturing for Yield</p><img src="http://feeds.feedburner.com/~r/mgc_silicon-yield/~4/ylUztqRh27g" height="1" width="1"/> Silicon Test and Yield Analysis Industry Article Mon, 06 May 2013 07:00:00 GMT http://www.mentor.com/bounce?redirect=http://www.edn.com/design/integrated-circuit-design/4412868/2/Design-for-manufacturing-and-yield&rssid=3d600c8d-75df-d4e5-59f7-6c6862ddd478 http://feedproxy.google.com/~r/mgc_silicon-yield/~3/N-57htlnTc4/bounce <p>&nbsp;</p><img src="http://feeds.feedburner.com/~r/mgc_silicon-yield/~4/N-57htlnTc4" height="1" width="1"/> Silicon Test and Yield Analysis Industry Article Mon, 06 May 2013 07:00:00 GMT http://www.mentor.com/bounce?redirect=http://www.edn.com/design/test-and-measurement/4413433/Ensure-FinFET-defect-coverage-with-cell-aware-test&rssid=3d600c8d-75df-d4e5-59f7-6c6862ddd478 http://feedproxy.google.com/~r/mgc_silicon-yield/~3/9vKxemd2e2o/bounce <p>&nbsp;</p><img src="http://feeds.feedburner.com/~r/mgc_silicon-yield/~4/9vKxemd2e2o" height="1" width="1"/> Silicon Test and Yield Analysis Industry Article Tue, 23 Apr 2013 07:00:00 GMT http://www.mentor.com/bounce?redirect=http://www.tmworld.com/electronics-blogs/test-voices/4412595/Boost-DFT-efficiency-for-large-SoCs-&rssid=3d600c8d-75df-d4e5-59f7-6c6862ddd478 http://feedproxy.google.com/~r/mgc_silicon-yield/~3/SdWSVtZuudM/bounce <p>See product demos on Tessent&reg;, the technology and market leading provider of comprehensive power-aware test solutions for today's nanometer scale 2D and 3D designs.</p><img src="http://feeds.feedburner.com/~r/mgc_silicon-yield/~4/SdWSVtZuudM" height="1" width="1"/> Silicon Test and Yield Analysis Event Mon, 08 Apr 2013 07:00:00 GMT http://www.mentor.com/bounce?redirect=/products/silicon-yield/events/semicon-west&rssid=3d600c8d-75df-d4e5-59f7-6c6862ddd478 http://feedproxy.google.com/~r/mgc_silicon-yield/~3/aoqJfbGSgL4/bounce <p>&nbsp;</p><img src="http://feeds.feedburner.com/~r/mgc_silicon-yield/~4/aoqJfbGSgL4" height="1" width="1"/> Silicon Test and Yield Analysis Industry Article Tue, 26 Feb 2013 08:00:00 GMT http://www.mentor.com/bounce?redirect=http://www.tmworld.com/electronics-blogs/other/4407827/Optimizing-autonomous-IC-test-without-sacrificing-precision&rssid=3d600c8d-75df-d4e5-59f7-6c6862ddd478 http://feedproxy.google.com/~r/mgc_silicon-yield/~3/xDgdD5Kk2_E/bounce <p>Use a smarter DFT tool environment for better design customization&nbsp;</p><img src="http://feeds.feedburner.com/~r/mgc_silicon-yield/~4/xDgdD5Kk2_E" height="1" width="1"/> Silicon Test and Yield Analysis Industry Article Tue, 05 Feb 2013 08:00:00 GMT http://www.mentor.com/bounce?redirect=http://www.tmworld.com/electronics-blogs/other/4406399/Use-a-smarter-DFT-tool-environment-for-better-design-customization&rssid=3d600c8d-75df-d4e5-59f7-6c6862ddd478