Silicon Test and Yield Analysis

Mentor delivers highest quality silicon test and failure analysis tools to ensure that each device produced will be free of defects before delivery. Effective test development tools achieve these quality targets while maintaining profitability with lower test costs.

Industry Leading Scan Test Tools

TestKompress® is part of the Mentor Graphics industry and technology-leading tool suite that delivers the highest quality scan test with the lowest manufacturing test cost. The tool suite comprises solutions for:

  • Scan insertion
  • Automatic test pattern generation (ATPG)
  • On-chip compression
  • Memory built-in self-test (BIST)
  • Logic BIST
  • Boundary scan insertion

High Quality Test Drives Yield and Failure Analysis

YieldAssist™ is an advanced scan test diagnosis tool that performs accurate and high-resolution diagnosis using tester failure data, design netlists, and layout data. YieldAssist is the solution for:

  • Effectively identifying root cause of manufacturing test failures
  • Enabling Diagnosis-Driven yield analysis
  • Accelerating failure analysis with high-volume online diagnosis

STIL Checker

STILVerify is the first commercially available syntax checker and verification tool for the STIL language, enabling developers of ATE, EDA and related tools to ensure compatibility with STIL-based flows. Download STIL Verify for free today. More

Design Flows Using TestKompress

Techpaper: Different embedded compression products and technologies have been tried and discarded as the marketplace selects the solution that best meets all the requirements. Read more

At-Speed and Advanced Fault Models for Achieving High Quality Test

Techpaper: With the increasing clock speeds and the decreasing feature sizes found in today's nanometer designs, at-speed testing is a requirement to achieve high quality test results. learn more

Yield Learning Flow Provides Faster Production Ramp

Industry Article: Today's yield management challenges require a statistical analysis tool that visualizes, drills down, and identifies observable and hidden yield-limiting defects with greater accuracy and more quickly than before. Read more

Solutions

Silicon Test Solutions

Mentor Graphics provides a complete set of tools for developing test for logic and embedded memory.

Memory Test Solutions

Typically, more than half of a chip’s functional area consists of memory arrays. Thorough testing of these arrays is essential for ensuring high product quality. Memory built-in self-test (MBIST) is the most effective method for thoroughly testing each memory.

Yield Analysis Solutions

Mentor Graphics provides diagnostic-driven yield analysis tools to analyze failing devices.

Techpubs and Resources

Silicon Test & Yield Analysis Techpubs

At-Speed and Advanced Fault Models for Achieving High Quality Test

techpub: With the increasing clock speeds and the decreasing feature sizes found in today's nanometer designs, at-speed testing is a requirement to achieve high quality test results. In addition, new advanced fault... View Techpub

Combining Compression with Fewer Pins Dramatically Saves I/O during Multi-Site Test

techpub: The manufacturing test process for ICs is increasing in cost and effort to keep up with rigorous quality standards, complexity of newer designs and process nodes, narrower time-to-market windows, and demand... View Techpub

High Quality Test Solutions for Secure Applications

techpub: Designs for secure applications such as smart cards and those used in the defense industry require security to ensure sensitive data is inaccessible to outside agents. Conversely, scan chains have been... View Techpub

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Faster Root Cause Analysis with YieldAssist - Presentation and Demo

On-demand Web Seminar

At the advanced design nodes now being manufactured, the ramp to expected yield is taking longer causing increased cycle times and reduced profits. This presentation discusses how using YieldAssist and... View Video

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Yield Ramp

Diagnosis-driven yield analysis can rapidly identify probable cause of failures, enabling you to implement corrective actions in the manufacturing process or make changes to the design. Accurate diagnosis allows you to accelerate yield ramp during initial production and improve expected yields for mature products, speeding your time to market and increasing profitability.
Learn more

News & Press