FastScan

FastScan™ has led the industry as the most powerful automatic test pattern generation (ATPG) tool available. FastScan is a powerful, yet simple, tool. For the occasional user, FastScan offers every feature needed to generate high coverage, compact test sets quickly, with just a single command. With its wide range of fault models, comprehensive design rules checks, extensive clocking support, and innovative algorithms for performance-oriented pattern compaction, FastScan leads the industry.

Benefits and Features

At-Speed Testing

  • Creates both launch-off-shift and broadside transition patterns
  • Critical Path Analysis capabilities generates robust sequential patterns
  • Supports the use of on-chip PLLs for delivering accurate at-speed clock edges

Testability Analysis and Debug

  • DFTVisualizer is integrated within FastScan for viewing and correcting testability problems
  • Graphical interface allows for viewing of session transcripts including active links for DRC, logic displays, file editing, documentation, and gate callouts

Performance and Quality

  • Highest performance ATPG for full and structured-partial scan designs
  • Uses distributed ATPG to reduce run time
  • Extensive fault model support including stuck-at, IDDQ, transition, path delay and bridging faults

Design Flow and Support

  • Automatic simulation mismatch debugging reduces test validation time
  • ATPG Accelerator provides increased test pattern generation performance

Related Products

  • TestKompressATPG with Embedded Compression. Industry leading automatic test pattern generation (ATPG) tool that delivers the highest quality scan test with the lowest manufacturing cost using patented on-chip compression techniques to reduce test data volume and time on automatic test equipment.
  • DFTAdvisorScan Logic Insertion. Creates all the scan test structures that enable optimal results using the TestKompress and FastScan ATPG tools.

Datasheet

Toolbox