LBISTArchitect

LBISTArchitect™ is used for test applications requiring a patternless test approach, such as in-system test, burn-in, field testing, and auxiliary testing. LBISTArchitect offers a complete solution for analyzing the design and adding the necessary test structures to get the best possible fault coverage.

Benefits and Features

  • Uses BIST methodology to embed test functionality into the device itself
  • Directly linked to BSDArchitect, the boundary scan JTAG interface
  • Patented multi-phase test point insertion (MPTI™) ensures high fault coverage
  • Speeds design implementation with BIST-ready capabilities including BIST DRCs and automatic resolution of BIST violations
  • Supports Hierarchical BIST in conjunction with BSDArchitect
  • Fully compatible with FastScan

Related Products

  • FastScanAdvanced Scan ATPG. A powerful automatic test pattern generation tool available with the wide range of fault models, comprehensive design rules checks, clocking support and innovative algorithms to generate high coverage, compact test sets quickly.
  • BSDArchitectBoundary Scan Generation & Verification. Dramatically reduces development time for adding boundary scan by substituting I/O pads and providing a flexible test access port (TAP) that supports boundary scan configurations for board manufacturing test to full system-on-chip (SoC) level test.

Datasheet

Toolbox