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Tessent® memory test solutions provide the industry’s most advanced memory self-test and repair capabilities.

Key features include comprehensive test and diagnostic capabilities to address the quality requirements of new process nodes and memory designs as well as comprehensive repair analysis and self-repair capabilities. Tessent memory test solutions also provide advanced design automation to ensure that all necessary embedded test and repair capabilities can be integrated quickly and efficiently into the design. This is key as the number of memories continues to grow.

Tessent memory test solutions support ICs of any size or complexity, reducing IC engineering development effort and improving time-to-market.


Tessent MemoryBIST

Mentor Graphics Tessent MemoryBIST provides a complete solution for at-speed testing, diagnosis, and repair of embedded memories. The solution’s architecture is hierarchical, allowing BIST and self-repair... View Product Overview

Tessent BoundaryScan

Mentor Graphics Tessent® BoundaryScan automates adding IEEE 1149.1 standard boundary scan support to ICs of any size or complexity. The boundary scan logic can be accessed throughout the life of the... View Product Overview

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