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Mentor Graphics support of ARM IP03:52Technology Overview: This video is an overview of the partnership between ARM® and Tessent®, Mentor Graphics silicon test solutions product group. Tessent and ARM co-developed support for the ARM shared bus where MemoryBIST... 03:52 Tags: ARM, Cortex, IP |
3D IC Test04:02Technology Overview: 3D-IC technology has been getting a lot of attention in the press and at technical conferences. Whether the 3D-IC is built on Silicon Interposers or stacked die with Through Silicon Vias, Mentor Graphics... 04:02 Tags: 3D IC |
Tessent Product Suite Overview04:11Technology Overview: Built on the foundation of the best-in-class test tools for each test discipline, Tessent® brings these solutions together in a powerful test platform that ensures total chip coverage. 04:11 |
DFM-Aware Yield Analysis04:11Technology Overview: This video provides an overview of the Mentor Graphics® DFM-Aware Yield Analysis. Based on Calibre® YieldAnalyzer®, Tessent Diagnosis, and Tessent YieldInsight® customers are able to identify... 04:11 |
Tessent YieldInsight Demonstration25:00Product Demo: This demonstration shows how using Tessent YieldInsight is utilized to locate systematic yield loss issues. 25:00 Tags: defect detection, design-for-yield, Diagnosis, Diagnosis driven yield analysis, Silicon Learning, Silicon Test, Tessent, Test Bring-Up, yield analysis, yield learning |
Optimizing Yield and Performance in a Nanometer World43:11Technology Overview: Optimize Yield and Performance in a Nanometer World 43:11 Tags: GLOBALFOUNDRIES, Silicon Learning, yield analysis, yield learning |
Low Pin Count Test with Embedded Compression48:04On-demand Web Seminar: This event will describe several methodologies that enable designers to reduce the number of pins and top level routing required for the application of high quality test. The focus will be on manufacturing... 48:04 Tags: Low Pin Count |
Delivering 10X Design Improvements44:00Technology Overview: Time and time again, escalating complexity has threatened to derail the IC industry from the extraordinary 35% annual reduction in transistor pricing it has enjoyed the past 40+ years. Fortunately, in... 44:00 |
Power Efficient Design Challenges and Trends27:49On-demand Web Seminar: This presentation covers key aspects to the forces from a technology and market perspective that are driving designers towards better energy efficient designs. 27:49 |
Power-Aware Silicon Test: Understanding Testing and Power-Sensitive Designs26:21On-demand Web Seminar: During this presentation we discuss the trends, drivers and solutions for power-aware test that have emerged. We will take a look at the technologies where power-aware test required, how designers are looking... 26:21 |
Avago Technologies and Mentor Graphics: Test Challenges and Solutions05:08Testimonial: Jason Brown, World Wide Test Manager, Avago Technologies, and Jay Jahangiri, Technical Marketing Engineer, Mentor Graphics, speak about silicon test challenges and solutions. 05:08 |
Yield Learning with Tessent Diagnosis and Tessent YieldInsight06:59Technology Overview: Indentifying the root cause of yield loss can take weeks or months using traditional methods. Learn how using the Tessent yield analysis solutions will significantly shorten this time. 06:59 |