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Multimedia Resource Center

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Featured Multimedia

Mentor Test Announcements at 2013 ITC


Technology Overview: Steve Pateras talks to EDA Café about what's new and hot in test from Mentor. 08:26

Tags: Cell Aware Test, IJTAG, ITC

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Tessent Product Suite Overview


Technology Overview: Built on the foundation of the best-in-class test tools for each test discipline, Tessent® brings these solutions together in a powerful test platform that ensures total chip coverage. 04:11

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Steve Pateras at DAC 2012


Technology Overview: Interview with Mentor Graphics' Steve Pateras at DAC 2012. 05:44

Tags: DAC

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3D IC Test


Technology Overview: 3D-IC technology has been getting a lot of attention in the press and at technical conferences. Whether the 3D-IC is built on Silicon Interposers or stacked die with Through Silicon Vias, Mentor Graphics... 04:02

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Mentor Graphics support of ARM IP


Technology Overview: This video is an overview of the partnership between ARM® and Tessent®, Mentor Graphics silicon test solutions product group. Tessent and ARM co-developed support for the ARM shared bus where MemoryBIST... 03:52

Tags: ARM, Cortex, IP

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The Defect-Free & High Yield DFT Solution for ARM IP


On-demand Web Seminar: ARM and Mentor Graphics have teamed up to provide their partners with DFT flows to deliver ARM-based products to the market in a timely manner, free from manufacturing defects and together with a high yield. 55:43

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Tessent BoundaryScan


Product Demo: This product presentation describes the advantages of using Tessent BoundaryScan for managing both internal and external tests. This tool is compliant with IEEE standards 1149.1 and 1149.6 to provide extensive... 08:15

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Using FastScan: Design-for-Test Demo


On-demand Web Seminar: This demo will show you how FastScan is used for at-speed testing and highlights the features of FastScan that enable more efficient and controlled at-speed test. 00:10:00

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