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Multimedia Resource Center

Showing: 1-8 of 8

Featured Multimedia

Process Technology Disruptions and the Evolution of Diagnosis Driven Yield Analysis

35:59

Technology Overview: Recent technology nodes have each brought about new process challenges that introduced manufacturing defects which required new yield learning methods. This presentation takes a look back at the recent... 35:59

Tags: DDYA, defect detection, design-for-yield, Diagnosis, Diagnosis driven yield analysis, diagnosis-drive yield analysis, FinFET, Silicon Learning, yield analysis, yield loss

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Identifying Systematic Yield Limiters Using Scan Test Diagnosis

Identifying Systematic Yield Limiters Using Scan Test Diagnosis

04:46

Technology Overview: At ISTFA 2012 , Mentor Graphics' Geir Eide, talks about how to identify systematic yield limiters using scan test diagnosis results. The International Symposium on Testing and Failure Analysis (ISTFA),... 04:46

Tags: Diagnosis, Diagnosis driven yield analysis, Scan Test Diagnosis, Silicon Learning, yield analysis

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Defect Localization Using Diagnosis w/Demo

Defect Localization Using Diagnosis w/Demo

07:20

Technology Overview: At ISTFA 2012, Mentor Graphics' Geir Eide, talks about how to localize defects using scan test diagnosis. This presentation includes a closer look at Tessent Diagnosis results and a demonstration of... 07:20

Tags: Diagnosis, Diagnosis driven yield analysis, Scan Test Diagnosis, Silicon Learning, yield analysis

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Tessent Product Suite Overview

Tessent Product Suite Overview

04:11

Technology Overview: Built on the foundation of the best-in-class test tools for each test discipline, Tessent® brings these solutions together in a powerful test platform that ensures total chip coverage. 04:11

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DFM-Aware Yield Analysis

DFM-Aware Yield Analysis

04:11

Technology Overview: This video provides an overview of the Mentor Graphics® DFM-Aware Yield Analysis. Based on Calibre® YieldAnalyzer®, Tessent Diagnosis, and Tessent YieldInsight® customers are able to identify... 04:11

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Optimizing Yield and Performance in a Nanometer World

Optimizing Yield and Performance in a Nanometer World

43:11

Technology Overview: During this video presentation we will discuss current yield challenges, introduce diagnosis-driven yield analysis, and share a few case studies. 43:11

Tags: Diagnosis, Diagnosis driven yield analysis

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Layout-Aware Diagnosis: Better Failure and Yield Analysis

Layout-Aware Diagnosis: Better Failure and Yield Analysis

26:06

On-demand Web Seminar: Scan logic diagnosis is a powerful tool to help failure analysis engineers determine the root cause of a failing die. Yield engineers, on the other hand, are interested in statistical analysis of volumes... 26:06

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Uncovering Hidden Yield Limiters - Production Test Diagnosis and Analysis

Uncovering Hidden Yield Limiters - Production Test Diagnosis and Analysis

00:15:00

On-demand Web Seminar:  In today's nm technology there is a new breed of defect which is systematic in nature, but cannot be identified by the traditional data available for yield analysis. The inability to identify these... 00:15:00

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