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Process Technology Disruptions and the Evolution of Diagnosis Driven Yield Analysis

35:59

Technology Overview: Recent technology nodes have each brought about new process challenges that introduced manufacturing defects which required new yield learning methods. This presentation takes a look back at the recent... 35:59

Tags: DDYA, defect detection, design-for-yield, Diagnosis, Diagnosis driven yield analysis, diagnosis-drive yield analysis, failure analysis, FinFET, Silicon Learning, Yield, yield analysis, yield loss

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Identifying Systematic Yield Limiters Using Scan Test Diagnosis

Identifying Systematic Yield Limiters Using Scan Test Diagnosis

04:46

Technology Overview: At ISTFA 2012 , Mentor Graphics' Geir Eide, talks about how to identify systematic yield limiters using scan test diagnosis results. The International Symposium on Testing and Failure Analysis (ISTFA),... 04:46

Tags: Diagnosis, Diagnosis driven yield analysis, failure analysis, Scan Test Diagnosis, Silicon Learning, yield analysis

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Defect Localization Using Diagnosis w/Demo

Defect Localization Using Diagnosis w/Demo

07:20

Technology Overview: At ISTFA 2012, Mentor Graphics' Geir Eide, talks about how to localize defects using scan test diagnosis. This presentation includes a closer look at Tessent Diagnosis results and a demonstration of... 07:20

Tags: Diagnosis, Diagnosis driven yield analysis, failure analysis, Scan Test Diagnosis, Silicon Learning, yield analysis

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Optimizing Yield and Performance in a Nanometer World

Optimizing Yield and Performance in a Nanometer World

43:11

Technology Overview: During this video presentation we will discuss current yield challenges, introduce diagnosis-driven yield analysis, and share a few case studies. 43:11

Tags: Diagnosis, Diagnosis driven yield analysis

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Showing: 1-4 of 4
 
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