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Multimedia Resource Center

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SEMICON West 2014

SEMICON West 2014

03:30

Technology Overview: Geir Eide, Mentor Graphics Product Marketing Manager, discusses Cell-Aware test, FinFet and more at SEMICON West 2014 03:30

Tags: cell-aware, FinFET

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Process Technology Disruptions and the Evolution of Diagnosis Driven Yield Analysis

Process Technology Disruptions and the Evolution of Diagnosis Driven Yield Analysis

35:59

Technology Overview: Recent technology nodes have each brought about new process challenges that introduced manufacturing defects which required new yield learning methods. This presentation takes a look back at the recent... 35:59

Tags: DDYA, defect detection, design-for-yield, Diagnosis, Diagnosis driven yield analysis, diagnosis-drive yield analysis, FinFET, Silicon Learning, yield analysis, yield loss

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