Sign In
Forgot Password?
Sign In | | Create Account

Multimedia Resource Center

Showing: 1-3 of 3

Process Technology Disruptions and the Evolution of Diagnosis Driven Yield Analysis

35:59

Technology Overview: Recent technology nodes have each brought about new process challenges that introduced manufacturing defects which required new yield learning methods. This presentation takes a look back at the recent... 35:59

Tags: DDYA, defect detection, design-for-yield, Diagnosis, Diagnosis driven yield analysis, diagnosis-drive yield analysis, failure analysis, FinFET, Silicon Learning, Yield, yield analysis, yield loss

View Video
Identifying Systematic Yield Limiters Using Scan Test Diagnosis

Identifying Systematic Yield Limiters Using Scan Test Diagnosis

04:46

Technology Overview: At ISTFA 2012 , Mentor Graphics' Geir Eide, talks about how to identify systematic yield limiters using scan test diagnosis results. The International Symposium on Testing and Failure Analysis (ISTFA),... 04:46

Tags: Diagnosis, Diagnosis driven yield analysis, failure analysis, Scan Test Diagnosis, Silicon Learning, yield analysis

View Video
Defect Localization Using Diagnosis w/Demo

Defect Localization Using Diagnosis w/Demo

07:20

Technology Overview: At ISTFA 2012, Mentor Graphics' Geir Eide, talks about how to localize defects using scan test diagnosis. This presentation includes a closer look at Tessent Diagnosis results and a demonstration of... 07:20

Tags: Diagnosis, Diagnosis driven yield analysis, failure analysis, Scan Test Diagnosis, Silicon Learning, yield analysis

View Video
Showing: 1-3 of 3
 
Online Chat