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Layout-Aware Diagnosis: Better Failure and Yield Analysis



This online event will teach you how to improve diagnosis accuracy and resolution by 70-80% depending on the defect type. You will learn how the large amount of data from layout-aware diagnosis is analyzed and how the results are reported, which is an important function of YieldAssist™.

Scan logic diagnosis is a powerful tool to help failure analysis engineers determine the root cause of a failing die. Yield engineers, on the other hand, are interested in statistical analysis of volumes of high-quality diagnosis results to determine yield limiters. To be of value for both engineers, a diagnosis tool needs to be accurate, have high resolution, and provide meaningful defect classifications.

Significant improvements have been made in scan logic diagnosis algorithms. However, the defect classifications, accuracy, and resolution provided by diagnosis tools can be insufficient for effective yield and failure analysis. By using the actual layout information, YieldAssist improves all three items, becoming a powerful tool in the hands of the failure analysis and yield engineers.

What You Will Learn

  • Overview of scan diagnosis flow
  • How layout-aware diagnosis provides superior results
  • Iterative diagnosis as a way to narrow in on the root cause


About the Presenter

Presenter Image Bruce Swanson

Bruce Swanson is a Technical Marketing Engineer in the Silicon Test Solutions division at Mentor Graphics. He received an MS in applied information management from the University of Oregon and a BS in computer engineering from North Dakota State University. Bruce has over 20 years of experience in EDA and computer hardware design.

Who Should View

  • Failure Analysis Engineers
  • Design Engineers
  • Design for Test Engineers
  • Engineering Managers
  • Anyone involved with the financial impact of identifying the root cause of failing die

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