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New Frontiers in Scan Diagnosis



Scan diagnosis is an established software-based technique for defect localization in digital semiconductor devices. In this webinar, you will learn about the most recent advances in diagnosis technology and how the role of diagnosis is expanding from just ‘where to look in PFA’ to ‘a test bed for checking hypotheses that explain what I found in PFA’. We will explore new technologies that dramatically reduce the noise in the diagnosis data, identify yield limiting design features, and address cell internal defects. The webinar includes results from industrial case studies.

What You Will Learn

In this webinar you will learn about ways that allow failure analysis to regain its effectiveness and position as a key contributor to yield improvement in digital semiconductor devices, as well as significantly improve the analysis of field returns. Topics to be covered include:

  • Learn how the combination of layout-aware diagnosis and design profiling can be leveraged to find and eliminate design dependent defects.
  • Understand how statistical enhancement techniques such as root cause deconvolution (RCD) eliminates noise from diagnosis data and determines the underlying root causes represented in a population of failing devices from test data alone.
  • Explore cell-aware diagnosis technology that can be used to find defects inside standard cells and combat the new challenges associated with FinFET technology


About the Presenter

Presenter Image Geir Eide

Geir Eide is the product marketing manager for the Silicon Learning Products in the Silicon Test Solutions group at Mentor Graphics. His current focus is on diagnosis and yield analysis. He has previously held positions related to design-for-test, semiconductor test, and silicon debug, in the design automation and semiconductor test industry. He earned BS and MS degrees in Electrical and Computer Engineering from the University of California at Santa Barbara, and has an engineering degree from Kongsberg College of Engineering, Norway.

Who Should View

  • Failure analysis lab managers and engineers who use or are interested in using scan diagnosis results as part of the defect localization process
  • Foundry engineering managers responsible for the collaborative effort with foundries to improve process yields
  • Engineering managers and product engineers responsible for the yield of individual products
  • Test and DFT engineers who enable and perform diagnosis

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