DFM-Aware Yield Analysis
This video provides an overview of the Mentor Graphics® DFM-Aware Yield Analysis. Based on Calibre® YieldAnalyzer®, Tessent Diagnosis, and Tessent YieldInsight® customers are able to identify DFM rules that best describe the design-process induced systematic defects. Resolving design-process induced systematic defects is one of the few ways that fabless semiconductor companies can directly improve their yield.
Recent technology nodes have each brought about new process challenges that introduced manufacturing defects which required new yield learning methods. This presentation takes a look back at the recent...…View Technology Overview
Scan diagnosis is an established software-based technique for defect localization in digital semiconductor devices. In this webinar, you will learn about the most recent advances in diagnosis technology...…View On-demand Web Seminar
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White Paper: Using diagnosis-driven yield analysis, companies have decreased their time to yield, managed manufacturing excursions and recovered yield caused by systematic defects. Dramatic time savings and yield gains...…View White Paper
White Paper: This whitepaper describes the benefits of implementing a diagnosis-driven yield analysis flow using the Tessent® Diagnosis and Tessent...…View White Paper