DFM-Aware Yield Analysis
This video provides an overview of the Mentor Graphics® DFM-Aware Yield Analysis. Based on Calibre® YieldAnalyzer®, Tessent Diagnosis, and Tessent YieldInsight® customers are able to identify DFM rules that best describe the design-process induced systematic defects. Resolving design-process induced systematic defects is one of the few ways that fabless semiconductor companies can directly improve their yield.
This video features information on Mentor Graphics' Tessent Diagnosis software, as demonstrated at ISFTA 2013's "Tools of the Trade" tour.…View Product Demo
In this webinar you will learn about ways that allow failure analysis to regain its effectiveness and position as a key contributor to yield improvement in digital semiconductor devices, as well as significantly...…View On-demand Web Seminar
At ISTFA 2012 , Mentor Graphics' Geir Eide, talks about how to identify systematic yield limiters using scan test diagnosis results. The International Symposium on Testing and Failure Analysis (ISTFA),...…View Technology Overview
Other Related Resources
White Paper: Using diagnosis-driven yield analysis, companies have decreased their time to yield, managed manufacturing excursions and recovered yield caused by systematic defects. Dramatic time savings and yield gains...…View White Paper
White Paper: This whitepaper describes the benefits of implementing a diagnosis-driven yield analysis flow using the Tessent® Diagnosis and Tessent...…View White Paper