DFM-Aware Yield Analysis
Technology Overview
Abstract
This video provides an overview of the Mentor Graphics® DFM-Aware Yield Analysis. Based on Calibre® YieldAnalyzer®, Tessent Diagnosis, and Tessent YieldInsight® customers are able to identify DFM rules that best describe the design-process induced systematic defects. Resolving design-process induced systematic defects is one of the few ways that fabless semiconductor companies can directly improve their yield.
Duration: 04:11
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