Identifying Systematic Yield Limiters Using Scan Test Diagnosis
At ISTFA 2012 , Mentor Graphics' Geir Eide, talks about how to identify systematic yield limiters using scan test diagnosis results. The International Symposium on Testing and Failure Analysis (ISTFA), sponsored by EDFAS, creates a unique venue for equipment suppliers, users and analysts to come together.
Recent technology nodes have each brought about new process challenges that introduced manufacturing defects which required new yield learning methods. This presentation takes a look back at the recent...…View Technology Overview
Scan diagnosis is an established software-based technique for defect localization in digital semiconductor devices. In this webinar, you will learn about the most recent advances in diagnosis technology...…View On-demand Web Seminar
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White Paper: Using diagnosis-driven yield analysis, companies have decreased their time to yield, managed manufacturing excursions and recovered yield caused by systematic defects. Dramatic time savings and yield gains...…View White Paper
White Paper: This whitepaper describes the benefits of implementing a diagnosis-driven yield analysis flow using the Tessent® Diagnosis and Tessent...…View White Paper