Scan Test Diagnosis in Electronics Failure Analysis
At this year's ISTFA Exposition, Mentor Graphics' Geir Eide, Product Marketing Manager, talks about/demonstrates Scan Test Diagnosis in Electronics Failure Analysis. The International Symposium on Testing and Failure Analysis (ISTFA), sponsored by EDFAS, creates a unique business venue for equipment suppliers, users and analysts to come together and do business, in a learning and networking environment.
At this year's ISTFA Exposition, Mentor Graphics' Geir Eide, Product Marketing Manager, talks about/demonstrates Scan Test Diagnosis of Defects in Semiconductor Devices. The International Symposium on Testing...…View Technology Overview
Built on the foundation of the best-in-class test tools for each test discipline, Tessent® brings these solutions together in a powerful test platform that ensures total chip coverage.…View Technology Overview
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