Defect Localization Using Diagnosis w/Demo
At ISTFA 2012, Mentor Graphics' Geir Eide, talks about how to localize defects using scan test diagnosis. This presentation includes a closer look at Tessent Diagnosis results and a demonstration of the Tessent YieldInsight product. The International Symposium on Testing and Failure Analysis (ISTFA), sponsored by EDFAS, creates a unique venue for equipment suppliers, users and analysts to come together.
Recent technology nodes have each brought about new process challenges that introduced manufacturing defects which required new yield learning methods. This presentation takes a look back at the recent...…View Technology Overview
Scan diagnosis is an established software-based technique for defect localization in digital semiconductor devices. In this webinar, you will learn about the most recent advances in diagnosis technology...…View On-demand Web Seminar
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