Tessent MemoryBIST

Product Demo

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In today’s ICs, memory commonly can take up more than 50% of the available silicon area. There is a growing need to make changes to the test algorithms during manufacturing test, and repairable memories are becoming more prevalent. This presentation discusses the challenges of memory test, and how the Mentor Graphics memory test solutions provide test as well as repair.

Duration: 10:02

Products: Tessent MemoryBIST

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