Sign In
Forgot Password?
Sign In | | Create Account

Bringing Compression and BIST Technologies Together

Video viewing problems? Contact Us.


The combination of compression and logic BIST provides the test techniques needed generate the highest quality test. Learn how these techniques, integrated using a common hierarchical SoC flow, provide the highest defect coverage while reducing overall test time.

Design Areas: Silicon Test and Yield Analysis | Products: Tessent LogicBIST, Tessent TestKompress

Online Chat