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DFM-Aware Yield Analysis

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This video provides an overview of the Mentor Graphics® DFM-Aware Yield Analysis. Based on Calibre® YieldAnalyzer®, Tessent Diagnosis, and Tessent YieldInsight® customers are able to identify DFM rules that best describe the design-process induced systematic defects. Resolving design-process induced systematic defects is one of the few ways that fabless semiconductor companies can directly improve their yield.

Design Areas: Silicon Test and Yield Analysis | Products: Tessent Diagnosis, Tessent YieldInsight

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