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DFM-Aware Yield Analysis

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This video provides an overview of the Mentor Graphics® DFM-Aware Yield Analysis. Based on Calibre® YieldAnalyzer®, Tessent Diagnosis, and Tessent YieldInsight® customers are able to identify DFM rules that best describe the design-process induced systematic defects. Resolving design-process induced systematic defects is one of the few ways that fabless semiconductor companies can directly improve their yield.


Design Areas Silicon Test and Yield Analysis
Design Tasks Silicon Learning
Products Tessent Diagnosis, Tessent YieldInsight
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