Sign In
Forgot Password?
Sign In | | Create Account

Identifying Systematic Yield Limiters Using Scan Test Diagnosis

Video viewing problems? Contact us.


At ISTFA 2012 , Mentor Graphics' Geir Eide, talks about how to identify systematic yield limiters using scan test diagnosis results. The International Symposium on Testing and Failure Analysis (ISTFA), sponsored by EDFAS, creates a unique venue for equipment suppliers, users and analysts to come together.


Design Areas Silicon Test and Yield Analysis
Design Tasks Silicon Learning
Products Tessent Diagnosis, Tessent YieldInsight
Online Chat