Identifying Systematic Yield Limiters Using Scan Test Diagnosis
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At ISTFA 2012 , Mentor Graphics' Geir Eide, talks about how to identify systematic yield limiters using scan test diagnosis results. The International Symposium on Testing and Failure Analysis (ISTFA), sponsored by EDFAS, creates a unique venue for equipment suppliers, users and analysts to come together.
Design Areas: Silicon Test and Yield Analysis | Products: Tessent Diagnosis, Tessent YieldInsight