Scan Test Diagnosis of Defects in Semiconductor Devices
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Description
At this year's ISTFA Exposition, Mentor Graphics' Geir Eide, Product Marketing Manager, talks about/demonstrates Scan Test Diagnosis of Defects in Semiconductor Devices. The International Symposium on Testing and Failure Analysis (ISTFA), sponsored by EDFAS, creates a unique business venue for equipment suppliers, users and analysts to come together and do business, in a learning and networking environment.
Details
Design Areas Silicon Test and Yield Analysis
Products Tessent Diagnosis