Uncovering Hidden Yield Limiters - Production Test Diagnosis and Analysis
On-demand Web Seminar
This presentation discusses how YieldAssist can provide a new depth of data to empower yield analysis in the nm era and uncover today's hidden systematic defects.
In today's nm technology there is a new breed of defect which is systematic in nature, but cannot be identified by the traditional data available for yield analysis. The inability to identify these systematic defects leads to suboptimal yields and the potential for quality and reliability escapes.
Process Technology Disruptions and the Evolution of Diagnosis Driven Yield Analysis
Recent technology nodes have each brought about new process challenges that introduced manufacturing defects which required new yield learning methods. This presentation takes a look back at the recent...…
Identifying Systematic Yield Limiters Using Scan Test Diagnosis
At ISTFA 2012 , Mentor Graphics' Geir Eide, talks about how to identify systematic yield limiters using scan test diagnosis results. The International Symposium on Testing and Failure Analysis (ISTFA),...…
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