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Uncovering Hidden Yield Limiters - Production Test Diagnosis and Analysis

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Overview

This presentation discusses how YieldAssist can provide a new depth of data to empower yield analysis in the nm era and uncover today's hidden systematic defects.

 In today's nm technology there is a new breed of defect which is systematic in nature, but cannot be identified by the traditional data available for yield analysis. The inability to identify these systematic defects leads to suboptimal yields and the potential for quality and reliability escapes.

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