Silicon Test and Yield Analysis Press Releases

• Mentor Graphics TestKompress ATPG Software Wins Test & Measurement World’s Test of Time Award (Apr 22, 2009)
• Mentor and NXP Achieve Major Milestone in Silicon Test Partnership (Mar 26, 2009)
• Mentor Graphics DFT Tools Adopted by STMicroelectronics for Advanced IC Testing Solutions (Jan 26, 2009)
• Mentor Graphics and Freescale Expand Collaboration to Improve Manufacturing and Testing of Nanometer Technologies (Jan 26, 2009)
• Mentor Graphics Outlines IC Implementation Strategy to Address Sub-45nm Challenges (Jun 9, 2008)
• Mentor Graphics Aligns Product Groups to Address IC Implementation Challenges at 45nm and Beyond (May 7, 2008)
• Mentor Graphics Announces Partnership with NXP Semiconductors for Design-for-Test Tools and Technology (May 6, 2008)
• Mentor Graphics Announces TestKompress Xpress Technology to Address Manufacturing Test Requirements for 65 and 45 Nanometer Integrated Circuits (Oct 1, 2007)

Press Release Archives

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