Silicon Test and Yield Analysis News Archive

November 2006

Faraday Adopts Mentor Graphics TestKompress; Cites Significant Reduction in Test Time and Data Volume Nov 13, 2006

October 2006

Mentor Graphics TestKompress 2007 Improves on Productivity, Performance, and Test Quality Oct 23, 2006

Mentor Graphics YieldAssist Supports Automated,Server-based Use Model for Rapid Yield Learning Oct 23, 2006

August 2006

Mentor Graphics to Deliver Select EDA Technologies To Freescale Semiconductor Aug 14, 2006

July 2006

Mentor DFT Tools Fully Support TSMC's Reference Flow 7.0 Jul 18, 2006

Mentor Graphics Design-for-Test Team Awarded IEEE CEDA Donald O. Pederson Best Paper Award Jul 12, 2006

June 2006

ATI Implements Mentor Graphics Modular TestKompress for Production Test of Advanced 90nm Graphics Processor Jun 20, 2006

January 2006

Mentor Graphics and STARC Partner to Develop Improved At-speed Test Methods for Nanometer Design Jan 24, 2006