Tessent Yield Learning

Tessent Diagnosis

Using failure data from manufacturing test, scan test patterns, and design information, Tessent Diagnosis identifies the location and classification of the defect causing the failure.

Why Tessent Diagnosis?

The Tessent Diagnosis solution identifies the type and location of defects, establishing the foundation for diagnosis-driven yield and failure analysis.

Accurately identify defects and timing errors

Use layout-aware and cell-aware technology to determine a defect’s most probable failure mechanism, logic location and physical location.

Cell-aware diagnosis

Perform transistor-level diagnosis to identify defects inside standard cells. This capability leverages the same cell-aware fault model used for cell-aware ATPG and works for with any pattern type.

Correlate with DFM analysis

Diagnosis results can be correlated with DFM analysis results to identify critical design features. Tessent Diagnosis can read result databases (RDB) from Calibre Pattern Matching and Calibre YieldAnalyzer.

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