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Tessent FastScan

Tessent® FastScan™ simplifies the process of generating high-coverage compact test sets. Its ability to be applied to most any type of design makes it the most versatile ATPG solution available. Comprehensive at-speed test is critical to ensure high-quality testing. Tessent FastScan’s at-speed tests include transition, multiple detect transition, timing-aware, and critical path.

Benefits and Features

  • Extensive fault model support, including stuck-at, IDDQ, transition, path delay, and bridge.
  • On-chip PLL support for accurate at-speed test.
  • Ensures the highest performance ATPG for full and structured partial scan designs.
  • Reduces run time with no effect on coverage or pattern count using distributed ATPG.
  • Minimizes the effect of Xs and provide higher coverage with false and multicycle support.
  • Identifies testability problems early using comprehensive design rule checking.
  • Reduces test validation time with automatic simulation mismatch debugging.

Tessent FastScan MacroTest Option

Automates testing small embedded memories and cores with scan.

Award-Winning Technology

Best-in-Test: Test & Measurement  WorldBest-in-Test

Test & Measurement World, 1993

Best-in-Test: Test & Measurement  WorldBest-in-Test Honorable Mention

Test & Measurement World, 2004

Tessent Training

We have training courses available for Tessent products in our training centers around the world, online, or at your site. Tessent training courses

 
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