Tessent TestKompress
Tessent® TestKompress® delivers the highest quality deterministic scan test with the lowest manufacturing test cost. The solution uses a patented on-chip compression technique to create scan pattern sets that have dramatically less test data volume and reduced test time on the automatic test equipment.
Highlights
- Thorough testing of digital logic with scan-based patterns.
- Fast pattern generation through high-performance ATPG algorithms and distributed processing.
- A wide variety of fault models, including stuck-at, transition, path delay, multiple-detect, and more provide a thorough test program applicable to smaller geometry technologies.
- Supports low pin count test strategies (as few as one scan channel).
- Failure files can be analyzed with Tessent Diagnosis and Tessent YieldInsight.
Related Products
Tessent SoCScan
Tessent TestKompress can be used with Tessent SoCScan to take advantage of the Mentor Graphics automated hierarchical test integration and test generation flow. Tessent SoCScan makes use of shared isolation and capture-by-domain technologies to deliver independent core-level ATPG and chip-level pattern reuse. Tessent SoCScan
Tessent LBIST
Tessent TestKompress can be used as a stand-alone test strategy or in conjunction with Tessent LBIST. The combination of the two solutions enables application of any combination of pseudorandom, deterministic, or compressed deterministic patterns. This provides the maximum flexibility for achieving the most effective test time versus quality optimization. Tessent LogicBIST
Download White PapersLearn more about reducing routing congestion & test cost with low pin count compression Datasheet
ToolBox
- White Paper: The Robustness of Various Test Compression Techniques
- White Paper: High Quality Test Solutions for Secure Applications
- White Paper: Design Flows Using TestKompress
Contact Mentor Graphics
- Tessent TestKompress Info Request or call toll free: 1-800-547-3000
Award-Winning Technology
2001 – Tessent TestKompress - Product of the Year: Electronic Product
2002 – Tessent TestKompress - Best-in-Test: Test & Measurement World
2006 – Tessent TestKompress - Donald O. Pederson Award – IEEE
2008 – Tessent TestKompress - Best-in-Test Honorable Mention: Test & Measurement World
2009 – Tessent TestKompress - Test-of-Time: Test & Measurement World