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fact sheet

Tessent FastScan

Automatic test pattern generation

Tessent FastScan is the gold standard in automatic test pattern generation (ATPG), with support for a wide range of fault models, comprehensive design rule checks, extensive clocking support, and innovative algorithms for performance-oriented pattern compaction. Its ability to be applied to any type of design makes it the most versatile ATPG solution available. Tessent FastScan is part of the Tessent Shell platform, which offers extensive capabilities for automation, customization, testability analysis, and debug.

Tessent FastScan supports all traditional fault models used for uncovering both static and dynamically activated defects. Timing-aware test uses SDF to ensure that the long paths in the design are tested.

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