Significantly reduce cycle time to root cause of yield loss
Tessent® YieldInsight® statistically analyzes diagnosis data to identify and separate systematic yield limiters before any failure analysis is done.
Tessent YieldInsight is specialized for understanding and identifying yield loss from scan test data and makes volume diagnosis results actionable. Using specialized data mining and statistical analysis techniques, the product eliminates noise from diagnosis data to determine the underlying root causes, identify systematic yield limiters, and select the best devices for failure analysis. This dramatically accelerates the time to root cause of yield loss.
Features and Benefits
- Significantly reduce cycle time to root cause of yield loss.
- Root cause deconvolution (RCD) technology removes the noise from diagnosis results and determines the underlying root causes
- Improve device selection for failure analysis, maximize success rate and relevance.
- Prioritize yield enhancement efforts.
- Dashboard indicates presence of systematic defects based on statistical test of independence for eight zonal types
- Drill-down capability to effectively pick die for failure analysis
- Pareto plot and analyze more than 100 failure and diagnosis signatures
- DFM-aware yield analysis identifies critical design features contributing to yield loss
Tessent YieldInsight Awards
Tessent YieldInsight has been nominated as a "Best in Test Finalist 2011: Semiconductor test". Vote Today
Tessent YieldInsight is listed in the recent EDN Hot 100 list. The Mentor Graphics Tessent YieldInsight software is specialized for understanding and identifying semiconductor yield loss from production scan test data. Augmenting traditional methods, this solution reduces the time to root cause by 75–90%. More
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