Significantly reduce cycle time to root cause of yield loss
Tessent® YieldInsight™ statistically analyzes diagnosis data to identify and separate systematic yield limiters before any failure analysis is done.
This eliminates the need for costly physical localization and reduces the time to determining root cause of yield loss from weeks to days. Selection of die for failure analysis is facilitated by automatically identifying die that clearly exhibit the identified systematic issues. This accelerates yield ramp compared to traditional techniques.
Features and Benefits
- Significantly reduce cycle time to root cause of yield loss.
- Automatically identify hidden yield limiters.
- Identify observable yield problem with test and diagnosis results visualization.
- Improve device selection for failure analysis, maximize success rate and relevance.
- Prioritize yield enhancement efforts.
- Dashboard indicates presence of systematic defects based on statistical test of independence for eight zonal types.
- Drill-down capability to effectively pick die for failure analysis.
- Pareto plot and analyze more than 50 failure and diagnosis signatures.
Indentifying the root cause of yield loss can take weeks or months using traditional methods. Learn how using the Tessent yield analysis solutions will significantly shorten this time. View Video