Silicon Test and Yield Analysis Resources
IEEE Conference Papers
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Read about the latest, innovative techniques in subjects such as proven DFT solutions, high quality test, compression solutions and yield improvements. These articles and conference papers will give you insight on Mentor Graphics technology.
Proven Silicon Test and Yield Analysis Solutions
Mentor's Tessent products are used effectively in billions of devices. Even products that are considered relatively new are already used in over a billion devices and over one thousand designs. All Mentor Tessent tools (including Tessent TestKompress and Tessent Diagnosis) are recommended in the latest TSMC and UMC reference flows.
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Customer Success Story
- Reducing The Design Impact Of DFT In The Nanometer Era
Most Effective Compression
Tessent TestKompress provides the highest level of compression possible. This compression not only dramatically reduces test time (and data) but can also be used for dramatic reduction of test pins and signals. In fact, as few as 1 scan channel can be used within Tessent TestKompress blocks.
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- Embedded Compression for Production Test