At-Speed and Advanced Fault Models for Achieving High Quality Test
Root Cause Deconvolution - The Next Step in Diagnosis Resolution Improvement
Scan logic diagnosis turns failing test cycles into valuable data and is an established method for digital semiconductor defect localization. The advent of layout-aware scan diagnosis represented a dramatic...
Plug-and-Play Test Strategy for 3D ICs
As the industry transitions to 3D ICs, new test strategies are being developed to meet to two 3D IC test goals: improving the pre-packaged test quality and establishing new tests between the stacked die....