Defect Localization Using Diagnosis w/Demo
ISTFA 2013 Tools of the Trade: Mentor Graphics
This video features information on Mentor Graphics' Tessent Diagnosis software, as demonstrated at ISFTA 2013's "Tools of the Trade" tour.
Accelerating Yield and Failure Analysis with Diagnosis
In this webinar you will learn about ways that allow failure analysis to regain its effectiveness and position as a key contributor to yield improvement in digital semiconductor devices, as well as significantly...
Identifying Systematic Yield Limiters Using Scan Test Diagnosis
At ISTFA 2012 , Mentor Graphics' Geir Eide, talks about how to identify systematic yield limiters using scan test diagnosis results. The International Symposium on Testing and Failure Analysis (ISTFA),...